In-situ STM studies of strain-stabilized thin-film dislocation networks under applied stress

The effect of uniaxial applied stress on dislocation networks present in the atomic surface layer of Au(111) was studied. The measurements were made using a novel instrument combining ultrahigh vacuum scanned-probe microscopy with an in-situ stress-strain testing machine. The technique provides microscopic information, up to atomic resolution, about the large scale plasticity of surface layers under applied loads. The herringbone reconstruction of the Au(111) surface is a classic example of a strain stabilized dislocation network. We find that under 0.5% uniaxially applied compressive strain a dramatic restructuring of the network takes place. The three-fold orientational degeneracy of the system is removed and threading edge dislocations are annihilated. © 2001 Elsevier Science B.V. All rights reserved.